System LSI

Details System LSI System LSI

2006-01-31

2006-01-31

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S120000, C324S765010

Reexamination Certificate

active

06993447

ABSTRACT:
A system LSI includes a plurality of circuit blocks; a first power supply terminal, which is connected to a first circuit block; and a second power supply terminal, which is connected to a second circuit block. A first level of test voltage is applied from the first power supply terminal to the first circuit block for a predetermined period of time whereby the first circuit block is tested in operation. A second level of test voltage is applied from the second power supply terminal to the second circuit block for a predetermined period of time whereby the second circuit block is tested in operation independently from the first circuit block.

REFERENCES:
patent: 4255672 (1981-03-01), Ohno et al.
patent: 5072274 (1991-12-01), Kokado
patent: 5489538 (1996-02-01), Rostoker et al.
patent: 6043672 (2000-03-01), Sugasawara

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