System LSI

Details System LSI System LSI

2006-09-26

2006-09-26

Ramirez, Nestor (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C365S201000, C365S185330, C365S236000, C714S718000

Reexamination Certificate

active

07112984

ABSTRACT:
On a clock supply route to a specified block such as a ROM, there are provided a clock delay circuit which includes a plurality of delay elements connected in series and a selector, such that a delay clock signal is selected and output in accordance with a delay control signal. During a product test, an operation test for the specified block is carried out in order to find out the delay adjustment signal that exhibits a proper operation. For this purpose, the delay adjustment signal is supplied from a delay adjustment terminal via a selector. When a value of the delay adjustment signal is obtained in the product test, the value of the delay adjustment signal is memorized to a delay setting circuit including a fuse circuit or a PROM. In a normal operation, the memorized value in the delay setting circuit is supplied to the clock delay circuit via the selector.

REFERENCES:
patent: 5936900 (1999-08-01), Hii et al.
patent: 6058057 (2000-05-01), Ochiai et al.
patent: 6151692 (2000-11-01), Smitlener et al.
patent: 11-088142 (1999-03-01), None

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