Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1989-10-05
1991-07-09
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01B 902, G01J 345
Patent
active
050300075
ABSTRACT:
In an on-line scanning sensor system, certain components of an FT-IR interferometer are isolated from vibrations that cause inaccuracies in measurements provided by the system, thereby allowing the sensor system to be used on-line in manufacturing environments. More particularly, vibration-absorbing suspension devices suspend selected interferometer components such that the center of suspension of the suspended interferometer component is substantially coincident with the center of gravity of the suspended components.
REFERENCES:
patent: 4552723 (1985-11-01), Adams et al.
patent: 4556316 (1985-12-01), Doyle
patent: 4693603 (1987-09-01), Auth
patent: 4871142 (1989-10-01), de Mey, II
Calhoun David S.
Roth Mark S.
Koren Matthew W.
Measurex Corporation
Willis Davis L.
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