System for the automatic testing of printed circuits

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 73AT, 371 20, 371 27, G06F 1122, G01R 3128

Patent

active

046226478

ABSTRACT:
The test system comprises a standard basic unit with a central unit, a read-only memory, a read/write memory for recording test programs transmitted from a bulk memory and interfaces; the basic unit is connected to the card to be tested via a specific unit corresponding to the card to be tested to allow the realization of a static test. The test system further comprises a simulation device including: microprocessor simulation means connected to the busses of the basic unit and to a gripper connectable to the terminals of a microprocessor of a card to be tested to allow a dynamic test of the card to be tested at the real speed of the microprocessor of said card; and a ROM simulation means connected to the busses of the basic unit and to a plug which can be mounted on a support of a ROM package unit on the card to be tested to allow a functional test of said card to be performed by causing the microprocessor of said card to execute a program loaded in said ROM simulation means.

REFERENCES:
patent: 3961250 (1976-06-01), Snethen
patent: 4108358 (1978-08-01), Niemaszyk et al.
patent: 4125763 (1978-11-01), Drabing et al.
patent: 4168527 (1979-09-01), Winkler
patent: 4216539 (1980-08-01), Raymond et al.
patent: 4308615 (1981-12-01), Koegel et al
patent: 4312067 (1982-01-01), Shirasaka
patent: 4354268 (1982-10-01), Michel et al.
patent: 4380070 (1983-04-01), Steiner
patent: 4439858 (1984-03-01), Petersen
patent: 4450560 (1984-05-01), Conner
patent: 4455654 (1984-06-01), Bhaskar et al.
patent: 4500993 (1985-02-01), Jacobson
West et al: Analyzer+Emulation=Faster Board Testing, Electronic Design, Oct. 11, 1980, pp. 177-181.
Lyons: Microprocessor Based PCB's, The Testing Challenge. IEEE Electro 76 Professional Program Boston, May 1976, pp. 18-3/1-18-3/5.
Coffron: Serially Testing a Board's States Takes the Trickiness Out of Debugging It. Electronics, Jan. 27, 1982, pp. 100-103.
Peyrucat: Pour le Test de Cartes Ayez Une Approche Adaptee a vos Besoins, Mesures-Regulation-Automatisme (France) Nov. 1981-pp. 7-35 vol. 46, No. 11.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System for the automatic testing of printed circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for the automatic testing of printed circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for the automatic testing of printed circuits will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-380529

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.