System for testing semiconductors

Details System for testing semiconductors System for testing semiconductors

2011-05-10

2011-05-10

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07940069

ABSTRACT:
A testing system that includes an plural imaging devices capturing plural video sequences from a single optical path and concurrently displaying the video sequences for effectively positioning a probe for testing a semiconductor wafer.

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