Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-08-06
2009-08-04
Nguyen, Ha T. (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07570073
ABSTRACT:
A system for testing power supply performance is provided. The system includes a power supply having a plurality of outputs for outputting voltages, a plurality of display units corresponding to the plurality of outputs, for reflecting performance of the power supply, a plurality of resistance-matching selectors corresponding to the plurality of outputs, for supplying selective resistance, a voltage adjustable direct current source, and a selective switch. The display units are connected between first terminals of the outputs and the resistance-matching selectors, respectively. The resistance-matching selectors are in turn connected to ground. The voltage adjustable direct current source has a pole selectively connected to a second terminal of one of the outputs via the selective switch, and another pole grounded.
REFERENCES:
patent: 5397999 (1995-03-01), Kanamaru
patent: 6639409 (2003-10-01), Morimoto et al.
patent: 7112988 (2006-09-01), Xiao
patent: 7436200 (2008-10-01), Jacobsen et al.
Gan Xiao-Lin
Ho Yu-Kuang
Xiao Ren-Jun
Benitez Joshua
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( ShenZhen) Co., Ltd.
Nguyen Ha T.
Niranjan Frank R.
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