System for testing internal nodes

Details System for testing internal nodes System for testing internal nodes

1988-05-17

1991-04-30

Wieder, Kenneth

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 151, 371 251, 371 221, G01R 3128

Patent

active

050121804

ABSTRACT:
The testing circuit for testing internal nodes of a device includes storage for storing the test addresses of selected internal nodes in the device. A decoder responds to a test command from a microprocessor for selecting the test addresses from the storage and supplies the test addresses to an address bus in place of other addresses supplied to the address bus. A test decoder responds only to the test addresses on the address bus for enabling the transfer of data between the selected internal nodes in the data bus for testing the selected internal nodes.

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