System for testing integrated circuits

Details System for testing integrated circuits System for testing integrated circuits

2005-12-06

2005-12-06

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

C702S117000, C702S118000, C702S121000

Reexamination Certificate

active

06973402

ABSTRACT:
A system for testing integrated circuits by testing the change of integrated circuits under various temperatures comprises: at least one two-dimensional matrix testing module which includes a testing section having arrays for plugging integrated circuits to be tested, a heating section corresponding with the above testing section for heating integrated circuits respectively; a computer mainframe for connecting said two-dimensional matrix testing module and controlling the whole operations of the testing system, and a database. With the above-described structure, said database and said two-dimensional matrix testing module can be connected with the computer mainframe such that the temperature control information can be transmitted to provide each heater of said heating section to generate a suitable temperature, heat the integrated circuit to be tested, and store the test information.

REFERENCES:
patent: 6392427 (2002-05-01), Yang
patent: 6730545 (2004-05-01), Chang et al.

Affiliated with

Also associated with

Rating

System for testing integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for testing integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for testing integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3490381