System for testing circuit board integrity

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324754, G01R 3102, H01H 3102

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active

060548630

ABSTRACT:
A system for testing circuit boards comprising a probe network having a plurality of probes wherein each probe is adapted for contacting an end of a corresponding circuit board network and wherein each probe and network define a node having an address. The system further comprises a control device that includes a node address generator and a timing circuit having an output for outputting a pulse to the node having the address generated by the node address generator and for coupling the remaining nodes to electrical ground. The system further comprises a comparator for comparing the pulse outputted by the timing circuit to predetermined data.

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IBM Technical Disclosure Bulletin, Jun., 1995 vol. 38 No. 6, pp. 507-508 J. Boyette and J. C. Mahlbacher Method for Eliminating Common Defects from Capacitance Opens Shorts Data.

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