X-ray or gamma ray systems or devices – Electronic circuit – Exposure timer
Patent
1992-04-27
1993-10-12
Porta, David P.
X-ray or gamma ray systems or devices
Electronic circuit
Exposure timer
378 62, 378 96, 358111, H05G 164
Patent
active
052532828
ABSTRACT:
A dual energy x-ray system for determining bone density and the like compensates for variable flux density associated with the different absorptions and the production of the high and low energies of x-rays by controlling both the voltage biasing the x-ray tube and the relative dwell times during which the x-ray tube is at those voltages, the dwell time being increased for the lower voltage to compensate for lower flux density. Compensation for variations in flux density improves the resultant signal-to-noise ratio of the measurements taken and thereby provides more accurate measurement of materials with minimized examination time.
REFERENCES:
patent: 3848130 (1974-11-01), Macovski
patent: 3904874 (1975-09-01), Amtmann et al.
patent: 3965358 (1976-07-01), Macovski
patent: 4029963 (1977-06-01), Alvarex et al.
patent: 4355331 (1982-10-01), Georges et al.
patent: 4361901 (1982-11-01), Daniels et al.
patent: 4542459 (1985-09-01), Riederer
patent: 4947414 (1990-08-01), Stein
patent: 5132995 (1992-07-01), Stein
patent: 5148455 (1992-09-01), Stein
Simulation Studies of Dual-Energy X-Ray Absorptiometry, Sorenson et al., Med. Phys. 16(1), Jan./Feb. 1989.
Generalized Image Combinations in Dual KVP Digital Radiography, Lehmann, et al., Med. Phys. 8(5), Sep./Oct. 1981.
Lunar Corporation
Porta David P.
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