System for scan testing of logic circuit networks

Details System for scan testing of logic circuit networks System for scan testing of logic circuit networks

1987-10-07

1989-08-08

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

371 20, 371 25, G01R 3128

Patent

active

048556696

ABSTRACT:
The integrity of a circuit processing logic signals is verified by use of switching means, including pass transistors, which are selectively varied to provide different test circuit configurations for different modes of operation. The circuit operates in normal, scan, test and data receive modes. During normal operation, the logic signal from the primary circuit is passed directly through a logic test block without the shifting of data in the logic test block.

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