System for recording and readout of information at atomic scale

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium

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346 11, 346158, 365118, 430 31, G11B 900

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active

048782130

ABSTRACT:
A recording and readout information system having atomic scale densities comprises a recording medium having a carrier and means to form a pattern of atomic particles on the surface of the carrier. The atomic particles having an affinity for the carrier and can adhere to the surface to form a relatively adhesive and stable bond. The pattern of atomic particles produced on the carrier are representative of recorded information, e.g. binary represented information, of ultra high density based upon the size and spacing of such particles, which is in the range, for example, of 5 .ANG. (0.5 nm) to 10 .ANG. (1 nm). A preferred embodiment of the invention comprises a recording medium with an adsorbent carrier, means to form a pattern of adsorbate atomic particles on the surface of the adsorbent carrier, the adsorbate atomic particles having an adsorptive affinity for the adsorbent carrier. The adsorptive particles having an adsorptive affinity for the adsorbent carrier due, at least in part, to electrical attraction characteristics between the adsorbate atomic particles and the adsorbent carrier. Readout means, utilizing the tunnel current effect, is employed to determine the presence or absence of the atomic particles on the surface of the carrier and produce an electrical signal representative of the pattern of recorded information on the recording medium.

REFERENCES:
patent: 3660087 (1972-05-01), Kaspaul et al.
patent: 3668106 (1972-06-01), Ota
patent: 3761895 (1973-09-01), Ellis et al.
patent: 3761951 (1973-09-01), Inoue et al.
patent: 3783196 (1974-01-01), Stanley
patent: 3814975 (1974-06-01), Wolfe et al.
patent: 3818493 (1974-06-01), Slack
patent: 3886530 (1975-05-01), Haber
patent: 4032901 (1977-06-01), Levinthal
patent: 4042936 (1977-08-01), Yoshikawa
patent: 4059443 (1977-11-01), Okumura
patent: 4133047 (1979-01-01), Levinthal
patent: 4213192 (1980-07-01), Christensen, Sr.
patent: 4340953 (1982-07-01), Iwamura et al.
patent: 4343993 (1982-08-01), Binning et al.
patent: 4494857 (1985-01-01), Ueno et al.
patent: 4575822 (1986-03-01), Quate
Binning et al, "The Scanning Tunneling Microscope", Scientific American, pp. 50-56, Aug. 85.
Binning et al; "Surface Studies by Scanning Tunneling Microscopy", Phys. Rev. Letters, vol. 49(1), pp. 57-61, 7/5/82.
Binning et al, "7.times.7 Reconstruction on Si(III) Resolved in Real Space"; Phys. Rev. Letters, vol. 50(2), pp. 120-123 (1/10/83).
Gwynne, "IBM Researchers Utilize Vacuum Tunneling for High Resolution Microscopy Technique", Industrial R&D, pp. 72-73 (May, 73).
"A Review of `Electrofax` Behavior"; Amick; RCA Review, pp. 453-769.
"Xerography and Related Processes"; Dessauer & Clark; The Focal Press, pp. 59-61, .COPYRGT.1965.
Kazan et al, "Image-Storage Panels Based on Field Effect Control of Conductivity", Proc. of IEEE, vol. 56(3), pp. 285-295, Mar. 68.
Mochel et al, "Electron Beam Writing on A 20 .ANG. Scale/N Metal B-Aluminas", App. Physics Letters, vol. 42(4), pp. 392-394, 2/83.

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