Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Reexamination Certificate
2005-01-18
2005-01-18
Mohamedulla, Saleha R. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Including control feature responsive to a test or measurement
C430S320000, C355S018000
Reexamination Certificate
active
06844123
ABSTRACT:
The present invention relates to a method and a system for producing large area display panels with improved precision. The system according to the invention comprises a first mask producing means (1) for producing a mask with a predetermined pattern according to input data and microlithographic exposing means (2) for exposing a photosensitive substrate with light and with use of a mask to impose the pattern of the mask on the substrate, whereby said substrate has a layer being sensitive to said light. Further, the system comprises measuring means (3) for measuring the pattern on the substrate and detecting deviations relative to the intended pattern as given by the input data, and second mask producing means (1) for producing a second mask according to second input data, and being controllable according to said measurement, to modify the pattern on the mask to compensate for the measured deviations, and thus compensate for production distortions.
REFERENCES:
patent: 5815685 (1998-09-01), Kamon
patent: 0467076 (1992-01-01), None
patent: 9705526 (1997-02-01), None
Åman Johan
Ekberg Peter
Harness & Dickey & Pierce P.L.C.
Micronic Laser Systems AB
Mohamedulla Saleha R.
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