Optics: measuring and testing – By alignment in lateral direction
Patent
1993-05-20
1995-11-28
Turner, Samuel A.
Optics: measuring and testing
By alignment in lateral direction
382141, 348 87, G01B 1127
Patent
active
054713102
ABSTRACT:
A guidance type placement apparatus for placing and mounting integrated circuit (IC) components or devices, especially fine pitch integrated circuit devices (FPD), in aligned combination with printed circuit boards. The apparatus includes an image acquisition processing subsystem. The image acquisition subsystem is operative to generate images of at least one pair of diagonally opposed corners of the placement site and IC device from the same optical perspective.
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IBM Technical Disclosure Bulletin "Optical Inspection/Alignment of Multisided Component Connections"., Sep., 1987, vol. 30 No. 4.
DeCarlo John M.
Spigarelli Donald J.
Sierra Research and Technology, Inc.
Turner Samuel A.
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