System for performing fast testing during flash reference...

Details System for performing fast testing during flash reference... System for performing fast testing during flash reference...

2007-01-02

2007-01-02

Nguyen, Tan T. (Department: 2827)

Static information storage and retrieval

Floating gate

Particular biasing

C365S201000, C365S210130

Reexamination Certificate

active

11089268

ABSTRACT:
An embedded circuit in a memory device is used in place of an external test device to perform time-consuming tasks such as voltage verification during the setting of reference cells. An external test device programs at least one reference cell to a predetermined value. The embedded circuit uses the cell programmed by the external device as a comparative reference to program additional reference cells.

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