System for obtaining displacement-amplitude information from a q

Details System for obtaining displacement-amplitude information from a q System for obtaining displacement-amplitude information from a q

1977-12-09

1979-08-21

Clark, Conrad J.

Optics: measuring and testing

By particle light scattering

With photocell detection

356360, 73603, G01B 902

Patent

active

041651820

ABSTRACT:
A method and apparatus for directly obtaining displacement-amplitude information from a quadrature-dual interferometer. The system uses a "mini-wiggler" to introduce phase shift into the reference beam, as by oscillating a reference mirror with a piezo-electric crystal. The mini-wiggler produces relatively small phase perturbations of the order of 0.001.lambda. at a frequency at either edge or in the middle of the signal frequency band. The system uses a signal-processing circuit to obtain displacement amplitude directly. The purpose of the mini-wiggler is to produce a "pilot" signal of known amplitude and phase from which the correction terms needed to compensate for variations in the interferometer state, such as those caused by vibration, large variation, drift, and the like, are derived and can be applied by means of another signal processing circuit.

REFERENCES:
patent: 3202052 (1965-08-01), Rambauske
patent: 3969578 (1976-07-01), Mezrich et al.
patent: 4019818 (1977-04-01), Vilkomerson

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