Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring
Reexamination Certificate
2005-09-13
2008-10-21
Ramos-Feliciano, Eliseo (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Remote supervisory monitoring
C702S081000, C709S217000, C709S223000, C700S009000, C700S108000
Reexamination Certificate
active
07440870
ABSTRACT:
The invention relates to a system for monitoring industrial processes, comprising sensor means for detecting one or more process quantities in at least one process station, acquisition and processing means operating on signals generated by the sensor means for obtaining information on process quality and means for managing the manufacturing flow operating on the basis of the information on process quality. The acquisition and processing means are arranged locally in the at least one process station, the means for managing the manufacturing flow are arranged in a remote position with respect to the acquisition and processing means, and it is provided for wireless transceiver means for exchanging the information on process quality between the acquisition and processing means and the means for managing the manufacturing flow.
REFERENCES:
patent: 5227988 (1993-07-01), Sasaki et al.
patent: 5353238 (1994-10-01), Neef et al.
patent: 7124063 (2006-10-01), D'Angelo et al.
patent: 2002/0168937 (2002-11-01), Clark et al.
patent: 2003/0057191 (2003-03-01), Wright et al.
patent: 0 247 291 (1987-12-01), None
patent: 1 361 015 (2003-11-01), None
patent: 1 371 443 (2003-12-01), None
patent: 1 275 464 (2004-05-01), None
Lonnblad et al., ‘Optimization of Wireless Bluetooth Sensor Systems’, Sep. 1-5, 2004, IEEE Article, pp. 2133-2136.
Wang et al., ‘Communication of Agent-based Adhered Slice of Intelligent Manufacturing System’, Aug. 2004, IEEE Article, pp. 708-713.
Sairam et al., ‘Topics in Broadband Access: Bluetooth in Wireless Communicaiton’, Jun. 2002, IEEE Publication, pp. 90-96.
Patent Abstracts of Japan, vol. 2003, No. 11, Nov. 5, 2003 & JP 2003 191079, Jul. 8, 2003.
Patent Abstracts of Japan, vol. 1998, No. 10, Aug. 31, 1998 & JP 10 128538, May 19, 1998.
Patent Abstracts of Japan, vol. 1999, No. 02, Feb. 26, 1999 & JP 10 305366, Nov. 17, 1998.
D'Angelo Giuseppe
Pasquettaz Giorgio
Terreno Andrea
C.R.F. Società Consortile per Azioni
Desta Elias
Nixon & Vanderhye P.C.
Ramos-Feliciano Eliseo
LandOfFree
System for monitoring the quality of industrial processes... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for monitoring the quality of industrial processes..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for monitoring the quality of industrial processes... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3998848