Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate
2006-03-07
2006-03-07
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having partially reflecting plates in series
C372S034000
Reexamination Certificate
active
07009716
ABSTRACT:
A system for monitoring an optical output/wavelength is employed to be used for a WDM system having a narrow channel space by structuring an etalon and photodiode as an integrated structure. The system includes: a laser source control unit for controlling the laser source; an optical/wavelength monitoring unit for monitoring an optical output/wavelength of the controlled laser source; a TEC control unit for controlling a TEC in order to constantly maintain the laser source of the optical output/wavelength monitoring unit to have a predetermined temperature; a temperature control unit for controlling a heater and a thermistor to set an etalon to a predetermined temperature, wherein the heater is attached on the optical output/wavelength monitoring unit and the thermistor is attached on the heater; a comparison unit for comparing the optical output signal and the wavelength signal, each of which is monitored by the optical output/wavelength monitoring unit; and a processing unit for comparing values of the compared signals with a preset value to control an input current or a temperature of the laser source.
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A Multi-wavelenght Locker for WDM System, 3 pages.
50 GHz Spacing, multi-wavelength tunable locker integrated in a transmitter module with a monolithic-modulator and a DFB-laser, 3 pages.
Choi Byung-Seok
Choi Kwang-Seong
Kim Jong-Deog
Lee Jong-Hyun
Moon Jong-Tae
Blakely & Sokoloff, Taylor & Zafman
Connolly Patrick J.
Electronics and Telecommunications Research Institute
Toatley , Jr. Gregory J.
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