System for monitoring optical output/wavelength

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Details

C372S034000

Reexamination Certificate

active

07009716

ABSTRACT:
A system for monitoring an optical output/wavelength is employed to be used for a WDM system having a narrow channel space by structuring an etalon and photodiode as an integrated structure. The system includes: a laser source control unit for controlling the laser source; an optical/wavelength monitoring unit for monitoring an optical output/wavelength of the controlled laser source; a TEC control unit for controlling a TEC in order to constantly maintain the laser source of the optical output/wavelength monitoring unit to have a predetermined temperature; a temperature control unit for controlling a heater and a thermistor to set an etalon to a predetermined temperature, wherein the heater is attached on the optical output/wavelength monitoring unit and the thermistor is attached on the heater; a comparison unit for comparing the optical output signal and the wavelength signal, each of which is monitored by the optical output/wavelength monitoring unit; and a processing unit for comparing values of the compared signals with a preset value to control an input current or a temperature of the laser source.

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patent: 6650667 (2003-11-01), Nasu et al.
patent: 6724789 (2004-04-01), Vujkovic-Cvijin
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patent: 2003-218446 (2003-07-01), None
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patent: 1020020019855 (2002-03-01), None
A Multi-wavelenght Locker for WDM System, 3 pages.
50 GHz Spacing, multi-wavelength tunable locker integrated in a transmitter module with a monolithic-modulator and a DFB-laser, 3 pages.

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