Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring
Reexamination Certificate
2007-07-31
2007-07-31
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Remote supervisory monitoring
C340S500000, C702S127000, C702S187000, C707S793000, C707S793000, C707S793000, C700S090000
Reexamination Certificate
active
11158868
ABSTRACT:
According to one embodiment, a method comprises storing metric definitions for at least one monitored component in a machine-readable format to a data storage device. The method further comprises enabling access by at least one monitoring tool to the metric definitions via a metric introspection interface. The method further comprises the at least one monitoring tool autonomously comprehending the metric definitions for use in processing monitoring data collected for the at least one monitored component.
REFERENCES:
patent: 3283304 (1966-11-01), Sinn et al.
patent: 3516063 (1970-06-01), Arkin et al.
patent: 3516072 (1970-06-01), Wallace, Jr.
patent: 3541513 (1970-11-01), Patterson
patent: 3623158 (1971-11-01), Liewelyn et al.
patent: 4057847 (1977-11-01), Lowell et al.
patent: 4227245 (1980-10-01), Edblad et al.
patent: T0104003 (1984-03-01), Hall et al.
patent: 4812996 (1989-03-01), Stubbs
patent: 5206812 (1993-04-01), Abumehdi
patent: 5504922 (1996-04-01), Seki et al.
patent: 5619654 (1997-04-01), Mukai et al.
patent: 5841975 (1998-11-01), Layne et al.
patent: 6571201 (2003-05-01), Royal et al.
patent: 2003/0204377 (2003-10-01), Royal et al.
patent: 2004/0216139 (2004-10-01), Rhoda et al.
patent: 2006/0015602 (2006-01-01), Inoue et al.
patent: 2007/0005302 (2007-01-01), Graupner et al.
patent: 0 278 163 (1988-08-01), None
Carney, D. et al., “Monitoring Streams—A New Class of Data Mangement Applications”, in Brown Computer Science Technical Report, TR-CS-02-04, pp. 0-13.
Ciuffoletti, A. et al., “Architecture of Monitoring Elements for the Network Element Modeling in a Grid Infrastructure”, presented in Computing in High Energy Physics, La Jolla, California Mar. 24-28, 2003, pp. 1-4.
Configuring Metric Collection for z/OS Systems, Tivoli Software, [online] [Retrieved on Sep. 14, 2005] Retrieved from: http://publib.boulder.ibm.com/tividd/td/ITMWI/SC23-4705-02/en—US/HTML/wasugmst39.htm, pp. 1-3.
Arlitt Martin F.
Farkas Keith I.
Graupner Sven
Rolia Jerome
Cosimano Edward R
Lange Richard P.
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