System for measuring wavefront tilt in optical systems and...

Details System for measuring wavefront tilt in optical systems and... System for measuring wavefront tilt in optical systems and...

2005-08-02

2005-08-02

Lee, Andrew H. (Department: 2877)

Optics: measuring and testing

By light interference

Having wavefront division

C250S201900

Reexamination Certificate

active

06924899

ABSTRACT:
A wavefront tilt measurement system for measuring the wavefront tilt of light passing through transmitting or receiving optical systems, the optical systems including a primary aperture and internal optical elements defining an optical system focal plane. A light source emits light at the optical system focal plane towards the internal optical elements such that light from the light source emerges from the primary aperture. A plurality of tilt sensors are disposed adjacent to the primary aperture to receive light emerging from the primary aperture. Each tilt sensor includes a sensor focal plane and a plurality of detector elements. Each tilt sensor generates at the focal plane a plurality of overlapping regions of zero and first order images of light emerging from the primary aperture. The measured intensity of light in the overlapping regions is used to determine the wavefront tilt of light emerging from the primary aperture.

REFERENCES:
patent: 4413909 (1983-11-01), Pohle
patent: 4518854 (1985-05-01), Hutchin
patent: 6498650 (2002-12-01), Davies
patent: 6548797 (2003-04-01), Ai
patent: 6587215 (2003-07-01), Davies
Hardy, John W.,Adaptive Optics For Astronomical Telescopes, Oxford University Press, 1998, pp. 135-175.

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