System for measuring tilt of image plane of optical system using

Details System for measuring tilt of image plane of optical system using System for measuring tilt of image plane of optical system using

1994-03-31

1995-09-05

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356356, 356363, 250237G, G01B 902

Patent

active

054483557

ABSTRACT:
A system used for measuring the tilt of an image formed by a lens. The measuring system has a light source, a diffraction grating, a reflection surface and a detector for detecting an interference pattern that is formed by the light after passing through the diffraction grating reflection surface and the lens.

REFERENCES:
patent: 3751170 (1973-08-01), Hidaka
patent: 3833807 (1974-09-01), Takeda
patent: 3879136 (1975-04-01), Takeda
patent: 5011287 (1991-04-01), Mino
patent: 5074666 (1991-12-01), Barnes et al.

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