System for measuring thickness of high speed moving film

Details System for measuring thickness of high speed moving film System for measuring thickness of high speed moving film

1990-01-22

1992-03-31

Harvey, Jack B.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324690, 324558, G01R 2726

Patent

active

051011662

ABSTRACT:
An on-line capacitance sensing system, including a capacitance sensor, for measuring changes in thickness of a plastic film which passes over the sensor in contacting relationship; the sensor is mounted to a carriage which may be reciprocated transversely across the width of the film, and a partial vacuum is applied to the sensor to assist in holding the moving plastic film in contacting relationship against the sensor.

REFERENCES:
patent: 3300716 (1967-01-01), Engert
patent: 3475956 (1969-11-01), Langlois et al.
patent: 3718037 (1973-02-01), Stringer et al.
patent: 4449398 (1984-05-01), Williams
patent: 4947131 (1990-08-01), Mayer et al.

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