System for measuring the surface geometry and surface...

Details System for measuring the surface geometry and surface... System for measuring the surface geometry and surface...

1999-09-07

2009-02-10

Desire, Gregory M (Department: 2624)

Image analysis

Pattern recognition

Feature extraction

C072S009100, C072S011700, C072S037000, C250S559190, C356S432000, C356S604000, C382S141000

Reexamination Certificate

active

07489820

ABSTRACT:
The invention relates to a device for producing a pattern on a surface for measuring, using a projector and a slide. The invention also relates to various advantageous embodiments of the measuring system.

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