Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Patent
1997-10-23
1999-10-26
Shah, Kamini
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
702 94, 348 95, 35613904, 356400, 25013905, G01C 906, G06F 1500
Patent
active
059743654
ABSTRACT:
The purpose of a system for measuring the location and orientation of an ect is to align one object with another by simultaneously measuring the six degrees of freedom of the objects. The system accomplishes the purpose by employing a linear optical detector array sensor on the first object and a pre-selected target pattern on a second object to measure the six degrees of freedom and converting them to six position measurement via a microprocessor which has suitable algorithms residing in it. The six position measurements (azimuth, elevation, range, pitch, yaw and roll) are displayed for viewing by the operator who, then, manipulates the objects until pre-determined desired values of the six position measurements are obtained, indicating a complete alignment between the objects.
REFERENCES:
patent: 4810091 (1989-03-01), Sullivan
patent: 4845373 (1989-07-01), Jamison
patent: 4891829 (1990-01-01), Deckman
Bush Freddie M.
Chang Hay Kyung
Nicholson Hugh P.
Shah Kamini
The United States of America as represented by the Secretary of
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