System for measuring Q spacing in a kinescope panel

Details System for measuring Q spacing in a kinescope panel System for measuring Q spacing in a kinescope panel

1989-08-23

1990-12-25

Williams, Hezron E.

Electric lamp or space discharge component or device manufacturi

Apparatus

Testing or adjusting means

445 3, H01J 944

Patent

active

049799207

ABSTRACT:
A system for measuring the Q spacing of a kinescope panel without removing the mask from the panel includes an adder which stores the known thickness of the shadow mask and a known spacing. The adder also receives transducer inputs representative of measurements of the glass thickness, the distance of the shadow mask from a first reference plane and the distance of the panel from a second reference plane. The adder algebraically combines the stored and input data to yield an output representative of the Q spacing.

REFERENCES:
patent: 3537161 (1970-11-01), Kautz
patent: 4190936 (1980-03-01), Van Renssen
patent: 4307337 (1981-12-01), van den Berg et al.
patent: 4593368 (1986-06-01), Fridge et al.
patent: 4758728 (1988-07-01), Matey et al.
patent: 4850921 (1989-07-01), Hama et al.

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