Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1998-10-28
2000-09-05
Metjahic, Safet
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324614, G01S 740
Patent
active
06114858&
ABSTRACT:
Noise factor of a radio-frequency device under test (DUT) is determined by driving the input of the DUT with a randomly modulated sine wave and measuring the power of a resulting DUT OUTPUT signal within each of a set of equally-sized frequency bands. The noise factor is computed as a combination of the power of the modulated sine wave within each of a plurality of frequency bands and the measured power of the DUT OUTPUT signal within that same plurality of frequency bands.
REFERENCES:
patent: 4491783 (1985-01-01), Sawayama et al.
patent: 4905308 (1990-02-01), Davidson
patent: 5191294 (1993-03-01), Grace et al.
patent: 5970429 (1999-10-01), Martin
Bedell Daniel J.
Credence Systems Corporation
Metjahic Safet
Nguyen Vincent Q.
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