System for measuring laser spectrum

Details System for measuring laser spectrum System for measuring laser spectrum

1986-05-05

1988-12-13

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356346, G01B 902

Patent

active

047906553

ABSTRACT:
A system for measuring laser spectrum is disclosed in which the laser light to be measured is branched into one branched light and the other branched light so that the laser spectrum of the light is measured from a beat output resulting from mixing a delayed light obtained by delaying the one branched light for a certain period of time with the other branched light undelayed. In accordance with the present invention, the delay time of the delayed light undergoes such variations as to assume a value equal to an integral multiple of a fixed delay time by the use of an optical directional coupler.

REFERENCES:
patent: 4530097 (1985-07-01), Stokes et al.
Kikuchi et al., "High Resolution Measurement of the Spectrum of Semiconductor Lasers", Japanese Annual Review, Computers, Telecomm., 1982.

Affiliated with

Also associated with

Rating

System for measuring laser spectrum does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for measuring laser spectrum, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for measuring laser spectrum will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2193841