Image analysis – Applications
Patent
1997-02-10
1998-11-17
Tran, Phuoc
Image analysis
Applications
G06K 900
Patent
active
058388117
ABSTRACT:
A transparent curved surface is illuminated and view along an orthogonal axis to generate a cross-section image of the subject surface. This image is processed to extract the first and second surfaces which are then mathematically characterized and displayed to a user.
REFERENCES:
patent: 4685140 (1987-08-01), Mount, II
patent: 4784485 (1988-11-01), Ho
patent: 4939646 (1990-07-01), Essinger et al.
patent: 5539837 (1996-07-01), Lindmark
EyeSys.TM. Clinical Review, European Supplement, 3rd Quarter 1993, vol. 2, No. 3, pp. 3 and 5.
EyeSys.TM. Clinical Review, Published by EyeSys Technologies, Inc., 3rd Quarter 1993, vol. 2, No. 3, pp. 1, 2, 4; and sheet bearing the title "What's New From EyeSys".
"OPSM's EyeSys takes the trial and error out of fitting CLs", by Tom Padrick PhD, EyeSys Technologies, Houston, Texas, pp. 37 and 42; two sheets, one bearing the title The EyeSys.TM. Bottom Line For Optometry, Cost Analysis of the EyeSys Corneal Analysis System Model 3 (CAS3).TM., and the second sheet title being EyeSys.TM. CLMA 1993.
Fundamentals of Corneal Topography, Copyright 1992, EyeSys Technologies, Inc., pp. 1-11.
"The Corneoptor.TM. System" Reference Manual, Scientific Advances, Inc., 1st Edition, Jul. 1968.
LandOfFree
System for measuring curved surfaces does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for measuring curved surfaces, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for measuring curved surfaces will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-893201