Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-08-12
1996-02-13
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324525, 324538, 324713, 324718, G01R 2714
Patent
active
054914248
ABSTRACT:
A test fixture is provided for testing the resistance associated with contamination material on the surface of electrical contacts mounted to a printed circuit board. A probe used to engage the contacts consists of first and second conductive probe segments which form a sandwich about a layer of insulating material. A current source provides a constant alternating current which is applied across the first and second probe segments. Circuitry is provided for amplifying the alternating current voltage developed across the first and second probe segments in response to the constant current. Circuitry is provided for rectifying the amplified alternating current voltage to provide a direct current voltage which is proportional to the measured resistance of the contact engaged by the probe. Data corresponding to the bulk and contact resistance associated with the clean contact is stored in memory of a computer. The bulk resistance represented by the stored data is subtracted from the measured resistance represented by the DC voltage of the contact under test in order to determine the contamination resistance.
REFERENCES:
patent: 3611125 (1971-10-01), Press
patent: 3996514 (1976-12-01), Brown et al.
patent: 4706015 (1987-11-01), Chen
patent: 4771233 (1988-09-01), Wayne
patent: 5336990 (1994-08-01), Maue
"Ball Slides", TUSK catalog, p. 4, date unknown.
"Measuring the Contact Resistance of Circuit Pack Connectors", Gary E. Kleinedler, The Engineer, Second Issue 1983, pp. 11-15.
"Air Cylinder, Series CJ2", SMC catalog E223-A, pp. 27-28, 36, 106, date unknown.
Asar Madhu P.
Maddox Harry L.
AT&T Corp.
Brown Glenn W.
Warren Charles L.
Wieder Kenneth A.
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