System for measurement and detection of parameters and...

Optical waveguides – Optical waveguide sensor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C052S309900

Reexamination Certificate

active

07545998

ABSTRACT:
The subject of the invention is a system for measuring the state of panels in real time, particularly of one or more composite panels, characterized in that it has a network of very fine waveguides connected to a series of transducer sensors that are designed to send and receive signals in the waveguides, these sensors being themselves connected to a computer device such as a microprocessor device.

REFERENCES:
patent: 4581527 (1986-04-01), Crane et al.
patent: 4901584 (1990-02-01), Brunner et al.
patent: 5077820 (1991-12-01), Tokuda et al.
patent: 5118931 (1992-06-01), Udd et al.
patent: 5144690 (1992-09-01), Domash
patent: 5374821 (1994-12-01), Muhs et al.
patent: 6198861 (2001-03-01), Kellar et al.
patent: 6370964 (2002-04-01), Chang et al.
patent: 6564640 (2003-05-01), Allaei
patent: 6639681 (2003-10-01), Magne et al.
patent: 6640647 (2003-11-01), Hong et al.
patent: 6765194 (2004-07-01), Holz et al.
patent: 7050716 (2006-05-01), Nakaya et al.
patent: 2005/0061076 (2005-03-01), Kim
patent: WO 9953283 (1998-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System for measurement and detection of parameters and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for measurement and detection of parameters and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for measurement and detection of parameters and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4066650

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.