System for low voltage programming of non-volatile memory cells

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185030, C365S185280, C365S185210, C365S185180

Reexamination Certificate

active

07623389

ABSTRACT:
System for programming a selected non-volatile memory cell in a memory array having a gate node coupled to a wordline WL(n) and a drain node connected to a selected bitline by injecting hot carriers from a drain region of an injecting memory cell having a gate node coupled to a next neighbor wordline WL(n−1) into a floating gate of the selected non-volatile memory cell on the wordline WL(n).

REFERENCES:
patent: 6529410 (2003-03-01), Han et al.
patent: 6822909 (2004-11-01), Hamilton et al.
patent: 6894924 (2005-05-01), Choi et al.
patent: 6992929 (2006-01-01), Chen et al.
patent: 7002843 (2006-02-01), Guterman et al.
patent: 7057940 (2006-06-01), Hsu et al.
patent: 7259992 (2007-08-01), Shirota
patent: 7460405 (2008-12-01), Yoshino
patent: 2004/0080980 (2004-04-01), Lee
patent: 2008/0084761 (2008-04-01), Lee et al.
patent: 2008/0151627 (2008-06-01), Lee et al.
patent: 2009/0021987 (2009-01-01), Sarin et al.
patent: WO 02/096632 (2002-12-01), None
International Search Report dated Jun. 25, 2008 in PCT Application No. PCT/US2007/087481.
Written Opinion dated Jun. 25, 2008 in PCT Application No. PCT/US2007/087481.
Jae-Duk Lee et al., “A New Programming Disturbance Phenomenon in NAND Flash Memory By Source/Drain Hot-Electrons Generated By GIDL Current,” Proceedings of IEEE 21stNon-Volatile Memory Semiconductor Workshop p. 31 (2006).
Yoocheol Shin et al., “A Novel NAND-type MONOS Memory using 63nm Process Technology for Multi-Gigabit Flash EEPROMs,” IEDM Tech. Digest p. 337 (2005).
Ken'ichiro Sonoda et al., “Compact Modeling of Source-Side Injection Programming for 90nm-Node AG-AND Flash Memory,” Int'l Conf. on Simulation of Semiconductor Processes and Devices, p. 123 (2005).
Dana Lee et al., “Vertical floating-gate 4.5F2Split-gate NOR Flash Memory at 110nm Node,” Digest of Technical Papers, 2004 Symposium on VLSI Technology (2004).
Cheng-Yuan Hsu et al., “Split-Gate NAND Flash Memory at 120nm Technology Node Featuring Fast Programming and Erase,” Digest of Technical Papers, 2004 Symposium on VLSI Technology (2004).
Office Action for U.S. Appl. No. 11/614,879 mailed Apr. 17, 2009, 14 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System for low voltage programming of non-volatile memory cells does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for low voltage programming of non-volatile memory cells, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for low voltage programming of non-volatile memory cells will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4140921

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.