Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2005-12-22
2008-09-16
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237400
Reexamination Certificate
active
07426024
ABSTRACT:
A system for inspecting a disc-shaped substrate5is disclosed. The system100is surrounded by a housing. A table2that is movable in at least an X-direction and a Y-direction and is borne by a mounting plate22is provided within the housing50. The mounting plate22is vibration isolated in comparison to the housing50. Equally, an exhaust unit40is provided beneath the mounting plate22and arranged at a distance from it. The exhaust unit40possesses an opening36for air entry. The opening36for air entry is provided in the exhaust unit between an end of the mounting plate22and a wall of the housing50.
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Hiltawski, legal representative Frank A.
Hiltawski, legal representative Magdalena I.
Schenck Rene
Houston Eliseeva LLP
Toatley Jr. Gregory J
Ton Tri T
Vistec Semiconductor Systems Jena GmbH
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