System for improved flaw detection in polycrystalline diamond

Details System for improved flaw detection in polycrystalline diamond System for improved flaw detection in polycrystalline diamond

1985-02-04

1989-03-07

Derrington, James

Plastic and nonmetallic article shaping or treating: processes

Forming articles by uniting randomly associated particles

Autogenously or by activation of dry coated particles

51307, 51309, B29C 6700

Patent

active

048104477

ABSTRACT:
Disclosed is an improvement enabling a more reliable detection of flaws in polycrystalline diamond compacts by x-ray imaging and especially for compacts used for wire drawing dies. In an embodiment, wire die compacts are prepared having a polycrystalline diamond core disposed within a metal carbide annulus. In the core are uniformly dispersed less than five (5) percent by weight particles such as tungsten carbide which initially have an average particle size substantially less than the diamond particles used to form the polycrystalline mass.

REFERENCES:
patent: 2796706 (1957-06-01), Anderson
patent: 2818850 (1958-01-01), Schwarzkopf
patent: 3831428 (1974-08-01), Wentorf
patent: 3913280 (1975-10-01), Hall
patent: 4129052 (1978-12-01), Bieberich
patent: 4144739 (1979-03-01), Corbin
patent: 4268276 (1981-05-01), Bovenkerk
patent: 4370149 (1983-01-01), Hara et al.
Ortner (Editor), "On the Properties of Fine Grain Sintered Diamond Bodies", Proceedings of the 10th Plansee-Seminar, Metal Work Reutte, Austria, vol. 2, pp. 581-589.
Taylor, "Diamond-Impregnated Carboloy", General Electric Review, vol. 67, No. 2, Feb. 1934.

Affiliated with

Also associated with

Rating

System for improved flaw detection in polycrystalline diamond does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for improved flaw detection in polycrystalline diamond, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for improved flaw detection in polycrystalline diamond will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1667228