Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1992-02-12
1994-05-24
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324605, 324612, G01R 2700
Patent
active
053152573
ABSTRACT:
A system for evaluating the performance of an electrical filter installed on an electrical power supply network passing through the screening of a Faraday enclosure, includes a transmit device for transmitting an inlet electrical pulse to the inlet of the filter. A receive and processing unit receives and processes the response electrical signal at the outlet of the filter corresponding to the pulse. A display displays the results obtained by processing the signal. The inlet electrical pulse is coupled to the power supply network and is conveyed thereby through the filter. The response is obtained from the outlet of the filter by decoupling.
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Journal of Physics E. Scientific Instruments, vol. 16, No. 11, Nov. 1983, Dorking, GB, pp. 1003-1012; L. Weichert: "The avoidance of electric interference in instruments."
Revue Generale de L'Electricite, No. 2, Feb. 1987, Paris, France, pp.64-67; Champiot et al.: "Sensibilite Des Equipements Electroniques Aux Decharges Electrostatiques: La Norme CEI 801-2."
Digest of Technical Papers; 7th IEEE Pulsed Power Conf.; Monterey, Calif. Jun. 11-14, 1989, pp. 372-375 White et al.: "A Wide Bandwidth, High Dynamic Range, Analog Fiber Optic Link for EMP and EMC Testing."
Girard Christian
Guillard Jacques
Morin Pierre
Alcatel Cable
Brown Glenn W.
Wieder Kenneth A.
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