Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-04-14
1996-10-01
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 731, G01R 3102
Patent
active
055613772
ABSTRACT:
An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area. Because the transmission structure uniformly transfers signals, the relative condition of the signals as they enter or leave each end will substantially match the condition of the signals as measured or presented by the reference unit, thereby enabling calibration of the network in reference to the device-probing ends. The assembly is particularly well-adapted for the evaluation of probe measurement networks of the type used for testing planar microelectronic devices.
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"CHECKPOINT.TM.," product literature sheets (2 pages) for a probe card analyzer made by Applied Precision of Mercer Island, Washington (undated but prior to Apr. 14, 1995).
"PROBILT PB500A.TM. Probe Card Repair and Analysis Station," product brochure (4 pages) for a probe card analyzer made by Integrated Technology Corporation of Tempe, Arizona (undated but prior to Apr. 14, 1995).
J. D. Tompkins, "Evaluating High Speed AC Testers," IBM Technical Disclosure Bulletin, vol. 13, No. 7, Dec. 1970, pp. 1807-1808.
Carlton Dale E.
Gleason K. Reed
Schappacher Jerry B.
Strid Eric W.
Cascade Microtech, Inc.
Nguyen Vinh P.
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