Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2007-06-12
2007-06-12
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C073S514160, C073S514310, C324S200000, C324S219000, C324S247000
Reexamination Certificate
active
11157377
ABSTRACT:
The inventive device for evaluating the sensor signal includes the provider for providing the sensor signal, the processor for processing the sensor signal and for providing an information signal comprising information regarding the amplitude course of the sensor signal and means for comparing the sensor signal to a first and a second comparison value, wherein the first and/or the second comparison value are adjustable based on the information signal such that a difference between the first and the second comparison value comprises a non-linear relation to the amplitude course of the sensor signal.
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“Differential Hall Sensor”, Infineon Technologies, TLE4925/TLE4925C, pp. 1-25.
Dietmayer, Klaus C.J., “Integrated Online Diagnosis for AMR-based angular measurement systems”,Sensors and ActuatorsA 91:12-15.
Motz Mario
Werth Tobias
Cosimano Edward R
Infineon - Technologies AG
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