System for enhancing detection of sample components in plasma ba

Details System for enhancing detection of sample components in plasma ba System for enhancing detection of sample components in plasma ba

1994-01-04

1995-04-04

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

G01J 330

Patent

active

054042194

ABSTRACT:
A system and method for extending the limits of detection of plasma based sample analysis systems is disclosed. The preferred embodiment of the present invention system provides a reaction tube which is connected to both a furnace tube and a discharge tube. During use a nebulized sample is caused to pass through the furnace tube wherein its temperature is caused to become elevated. As well, a volatile atom containing, primarily molecular, gas is caused to flow through the discharge tube, while an energy providing electrical discharge occurs therein, such that dissociated volatile atoms are produced. The method of the present invention provides that typically elevated temperature nebulized sample, and the dissociated volatile atoms, be simultaneously entered into a reaction means wherein relatively easily dissociated molecules containing nebulized sample components are formed. The formed relatively easily dissociated molecules, being easier to dissociate than molecules present in the original nebulized sample, it should be appreciated effectively allow detection of nebulized sample components in a plasma based system utilizing the present invention, at lower concentration limits, compared to plasma analysis systems not utilizing the present invention.

REFERENCES:
patent: 3916034 (1975-10-01), Tsuchimoto
patent: 4378499 (1983-03-01), Spangler et al.
patent: 4633082 (1986-12-01), Sauers
patent: 4926021 (1990-05-01), Streusand et al.
patent: 5089746 (1992-02-01), Rosenblum et al.
patent: 5155547 (1992-10-01), Casper et al.

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