System for determining the bidimensional characteristic function

Details System for determining the bidimensional characteristic function System for determining the bidimensional characteristic function

1995-05-01

1997-07-22

Boudreau, Leo

Image analysis

Applications

Manufacturing or product inspection

3561245, G01M 1100

Patent

active

056510764

ABSTRACT:
A light source produces a light beam which is projected through a pattern to form a light beam incident on a surface of a continuous member. The pattern defines two transparent and opaque surfaces delimited by an angle. An opto-electronic device converts luminosity levels of elementary areas of a resultant image produced by the continuous member in a response to the incident light beam into respective electrical signal levels. A calculator calculates a bidimensional partial derivative for the electrical signal level corresponding to each elementary area of the resultant image as a function of the electrical signal levels produced by the opto-electronic device in response to respective luminosity levels of elementary areas contiguous to said each elementary area in order to produce the characteristic function. The optical member can be an optical instrument, a photographic film, a photoconductor or photoreceiver drum or, more generally, any optical image conversion device.

REFERENCES:
patent: 3938892 (1976-02-01), Klingman, III
patent: 4701782 (1987-10-01), Duvent
"An Accurate Method for Measuring the Spatial Resolution of Integrated Image Sensory", by J. Glasser et al, Image Processing, pp. 40-47, Sep. 19-21, 1988.

Affiliated with

Also associated with

Rating

System for determining the bidimensional characteristic function does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for determining the bidimensional characteristic function, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for determining the bidimensional characteristic function will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1565274