System for determining optical aberrations of a telescope optica

Details System for determining optical aberrations of a telescope optica System for determining optical aberrations of a telescope optica

1984-04-13

1986-11-04

Rosenberger, R. A.

Optics: measuring and testing

Lens or reflective image former testing

For optical transfer function

250201, 356121, G01B 906

Patent

active

046207902

ABSTRACT:
This invention is directed to a new and improved system for determining optical aberrations, such as for example alignment, focus, tilt, astigmatism or coma of a telescope optical system, wherein the telescope optical system is arranged for imaging a random scene and includes a plurality of subapertures, said system comprising a grating disposed at the focal plane of the telescope optical system, an apodizing mask disposed adjacent the grating, said mask having transparent and opaque portions, an array of light detectors, a field lens disposed adjacent the grating for causing the subapertures to be imaged on the array of detectors, apparatus for effecting relative movement between the grating and the other elements, phase detector electronics for receiving the output from the detectors and outputting individual detector signals, and a processor responsive to the detector signals for determining the difference in phase between the individual detector signals and a reference phase, whereby a measure of the aberration at each subaperture is effected.

REFERENCES:
patent: 2931911 (1980-05-01), Nichols
patent: 4141652 (1979-02-01), Feinlab
patent: 4370551 (1983-01-01), Fukuhara et al.
patent: 4438330 (1984-03-01), Hardy
Wyart, J. C., "Use of an AC Heterodyne Lateral Shear Interferometer with Real Time Wavefront Correction Systems".
Optics, Klein, John Wiley & Sons, 1970, p. 114.

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