System for detecting two X-ray energies

X-ray or gamma ray systems or devices – Beam control – Filter

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Details

378146, 250367, 2505051, G21K 300

Patent

active

048213063

ABSTRACT:
A system comprising an X-ray source (1), an elongate detector tube (3) including at least one cathode (5) extending in the longitudinal direction of the tube and at least one anode (6) located opposite to the cathode, a slit diaphragm (2), and a filter (4) mounted in the path between the X-ray source (1) and the detector tube (3). The filter (4) blocks relatively low energy X-radiation in a portion of the beam emitted by the source (1). The cathode (5) is provided with an X-ray detection layer consisting of two strips (8',8") extending in the longitudinal direction of the tube (3). One strip (8") receives the radiation passed by the filter (4) and the other strip (8') receives the unfiltered radiation. The one strip (8") is of considerably greater thickness than the other strip (8').

REFERENCES:
patent: 3784816 (1974-01-01), Abrahamsson
patent: 3944822 (1976-03-01), Dzubay
patent: 4132653 (1979-01-01), Samson
patent: 4132895 (1979-01-01), Froggatt
patent: 4149081 (1979-04-01), Seppi
patent: 4206361 (1980-06-01), Hounsfield et al.
patent: 4247774 (1981-01-01), Brooks
patent: 4255664 (1981-03-01), Rutt et al.
patent: 4292538 (1981-09-01), Carlson
patent: 4511799 (1985-04-01), Bjorkholm
patent: 4626688 (1986-12-01), Barnes
patent: 4675893 (1987-06-01), Duinker et al.
patent: 4715056 (1987-12-01), Vlasbloem et al.
"NaI(Tl)-CsI(Na) Phoswich Detectors for X-Ray Astronomy", Kurfess et al., IEEE Transactions on Nuclear Science, vol. NS-22, 2-1975.
"The Preparation and Performance of Thin Vacuum-Deposited CsI(Na) Scintillation Layers", by Van Der Ven, Nuclear Instruments and Methods, vol. 75, #2, 1969.
"Definition and Measurement of Means of Filtered X-Radiation", by Grudskii et al., Pribory i Tekhnika Eksperimenta, #4, Jul.-Aug. 1974.
"A Differential Counter For X-Ray Structural Analysis", by Vasil'ev et al., Pribory i Tekhnika Eksperimenta, #5, Sep.-Oct. 1974.

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