System for detecting foreign particles or voids in plastic mater

Details System for detecting foreign particles or voids in plastic mater System for detecting foreign particles or voids in plastic mater

1978-05-24

1980-04-08

Willis, Davis L.

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

250341, G01J 100

Patent

active

041974573

ABSTRACT:
A system for detecting foreign particles or voids in plastic material is disclosed herein and utilizes a far-infrared laser beam of electromagnetic radiation at a given wavelength. This laser beam is directed into the plastic material such that any portion thereof passing through the material unobstructed by voids or foreign matter does so along a predictable primary beam path, and such that any portion impinging a void or foreign particle is caused to scatter along predictable scattering paths including paths which are different than the primary beam path. In this way, at least one detector can be properly aligned in at least one of these different scattering paths for detecting a portion of the scattered radiation, thereby indicating the presence of a void or foreign particle.

REFERENCES:
patent: 3405270 (1968-10-01), Briggs
patent: 3693025 (1972-09-01), Brunton
patent: 3825755 (1974-07-01), Ruskin
patent: 3870884 (1975-03-01), Williams
patent: 4085326 (1978-04-01), Williams

Affiliated with

Also associated with

Rating

System for detecting foreign particles or voids in plastic mater does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for detecting foreign particles or voids in plastic mater, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for detecting foreign particles or voids in plastic mater will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-975108