System for detecting defects in articles using a scanning width

Details System for detecting defects in articles using a scanning width System for detecting defects in articles using a scanning width

1995-01-31

1996-09-24

Allen, Stephone

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

2502086, 25055945, 25055948, 356431, 356239, G01N 2100, G01N 2186

Patent

active

055593410

ABSTRACT:
An apparatus for sensing the deflection of a beam directed at an article detects slight deflection of the beam when the beam is directed at a large angle of incidence. The large angle of incidence increases the apparatus sensitivity to detect certain characteristics within an article which cause slight deflection, and allows the use of smaller optical elements. The apparatus can detect defects such as coating voids, streaks, and caliper variations when transparent materials are coated onto transparent substrates.

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International Patent Application No. WO PCT/US91/01421 filed 1 Mar. 1991 Applicant: INTEC CORP.

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