System for detecting compounds in a gaseous sample using photoio

Details System for detecting compounds in a gaseous sample using photoio System for detecting compounds in a gaseous sample using photoio

1996-07-26

1998-06-16

Regan, Maura K.

Electricity: measuring and testing

Using ionization effects

For analysis of gas, vapor, or particles of matter

324449, 324123, 73 2802, G01N 2762, G01N 2768

Patent

active

057676836

ABSTRACT:
A detection system measures very small concentrations of compounds of interest within gaseous samples. A spark discharge system induces pulsed spark discharges across a pair of electrodes within an inert gas in a gas flow chamber. Various reactions are induced by spark interaction with the flow of inert gas, and with any sample or dopant commingled with the inert gas, in the region of the pulsed spark discharge. This induces photon ionization which creates an instantaneous current flow within the gas flow chamber. Current flow is held constant for all concentrations of sample introduced into the gas flow by means of a control feedback system. The output of the control feedback system is indicative of sample concentration. The system responds linearly over approximately five orders of magnitude of sample concentration for use with the sample which will be described and low femtogram sensitivity is achieved.

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