System for detecting and correcting misalignment of semiconducto

Details System for detecting and correcting misalignment of semiconducto System for detecting and correcting misalignment of semiconducto

1990-01-19

1991-10-29

Wieder, Kenneth

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324537, 324538, G01R 3100

Patent

active

050618954

ABSTRACT:
A system for detecting whether the ends of leads of a semiconductor package are less than a small predetermined distance from a predetermined plane. The system uses a structure having a planar surface and an elevated portion on the surface where the portion is provided with a number of slots equal to or greater in number than the number of leads on one side of the package. The height of the slots above the surface is substantially equal to the predetermined distance. In order to test whether the end portions of the leads deviate from coplanarity by a distance greater than the predetermined distance, the package is placed with its leads in contact with the surface with the leads facing the slots. The package is then slid towards the slots to determine whether all of the leads will slide into the corresponding slots. The lateral distance between each pair of adjacent slots matches the distance between the corresponding pair of leads. Therefore, if any lead is bent laterally by a small amount, such bent lead may be corrected by first inserting the leads into the slots and then bending such bent lead against the sidewall of the slot corresponding to the lead.

REFERENCES:
patent: 4429275 (1984-01-01), Cedrone
"Mass Verification Gauge", by Hoover, West. Elec. Tech. Dig., #57, 1/80, pp. 11-12.
"Compensating Chuck Assembly for Braze Pin Testing Apparatus", by Comulada et al, IBM Tech. Disc. Bull., vol. 24, #10, 3/82, pp. 5144-5145.

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