System for computer assisted monitoring of a cross profile...

Details System for computer assisted monitoring of a cross profile... System for computer assisted monitoring of a cross profile...

2006-12-12

2006-12-12

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

Reexamination Certificate

active

07149650

ABSTRACT:
A system for computer assisted monitoring of a cross profile of a quality parameter of a material web, especially a paper or cardboard web during its production and/or conversion, which includes a measuring system for measuring the cross profile, at least one computer based operations and logic unit for the determination of the standard deviations of at least two interference profiles that are representative for different interferences in the form of different peak groups in the measured cross profile. The different peak groups differentiate in that their peaks have different width ranges. Elements for storage, display and/or further processing of the determined standard deviations are also included.

REFERENCES:
patent: 5781440 (1998-07-01), Adamy
patent: 6339727 (2002-01-01), Ladd

Affiliated with

Also associated with

Rating

System for computer assisted monitoring of a cross profile... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for computer assisted monitoring of a cross profile..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for computer assisted monitoring of a cross profile... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3702058