System for burn-in testing of electronic devices

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – Distinct contact secured to panel circuit

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S760020

Reexamination Certificate

active

07063544

ABSTRACT:
A system is provided which allows for burn-in testing of electronic devices wherein power current is provided individually to each one of the electronic devices. The system also includes various connectors, cables, and other configurations that allow for power currents having large magnitudes to be provided to the electronic devices.

REFERENCES:
patent: 4145620 (1979-03-01), Dice
patent: 4374317 (1983-02-01), Bradshaw
patent: 4432604 (1984-02-01), Schwab
patent: 4777434 (1988-10-01), Miller et al.
patent: 4924179 (1990-05-01), Sherman
patent: 4998180 (1991-03-01), McAuliffe et al.
patent: 5103168 (1992-04-01), Fuoco
patent: 5200885 (1993-04-01), Hamilton et al.
patent: 5329093 (1994-07-01), Okano
patent: 5429510 (1995-07-01), Barraclough et al.
patent: 5825171 (1998-10-01), Shin
patent: 6181146 (2001-01-01), Koyama
patent: 6340895 (2002-01-01), Uher et al.
patent: 6562636 (2003-05-01), Richmond et al.
patent: 6815966 (2004-11-01), Gunn et al.
patent: 19962868 (2000-08-01), None
patent: WO 01/04641 (2001-01-01), None
PCT International Search Report for PCT Application No. PCT/US03/20332, mailed Oct. 30, 2003 (8 pages).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System for burn-in testing of electronic devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for burn-in testing of electronic devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for burn-in testing of electronic devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3635999

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.