System for and method of testing transistors

Details System for and method of testing transistors System for and method of testing transistors

1980-11-24

1983-01-11

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 3122

Patent

active

043684254

ABSTRACT:
An improved system for and method of testing a transistor for its V.sub.be -I.sub.c characteristics independent of temperature is disclosed. The system for carrying out the method comprises means for generating a first signal which varies with temperature in accordance with the base-to-emitter voltage of the transistor as a function of temperature and means for generating a second signal which varies with temperature in accordance with the transconductance gain of the transistor as a function of temperature. Means are provided for modifying at least one of the first and second signals so that as modified the two signals vary with temperature in an equal and opposite manner to one another. The system also includes means for adding the two signals as modified so as to provide an output signal representative of the V.sub.be -I.sub.c characteristics of the transistor independent of temperature.

REFERENCES:
Alden, et al., "Pulsed Measuring . . . ; " Electronics Letters; vol. 9; No. 4; Feb. 22, 1973; pp. 82-83.

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