Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2006-06-06
2006-06-06
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Reexamination Certificate
active
07057717
ABSTRACT:
Disclosed are system for and method of analyzing the substantially the exact same point on a sample system with at least two wavelengths, or at least two ranges of wavelengths for which the focal lengths do not vary more than within an acceptable amount.
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Goeden Christopher A.
He Ping
Herzinger Craig M.
Johs Blaine D.
Liphardt Martin M.
J.A. Woollam Co. INC
Nguyen Tu T.
Welch James D.
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