X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2004-12-06
2010-06-01
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
Reexamination Certificate
active
07729472
ABSTRACT:
A system to analyze the geometry of a radiation treatment apparatus, software, and methods are provided. The system includes an apparatus having a rotating assembly and a trackable body or plurality of trackable bodies, to mark a location of a preselected portion of the rotating assembly. The system also includes a trackable reference fixture and can include a constant orientation trackable body. A determiner determines the position and/or orientation of the trackable bodies, the trackable reference fixture, and constant orientation trackable body. The determiner then determines the geometry of the treatment apparatus to analyze a coordinate system used by an operator. The determiner can have a memory and geometry analyzing software stored in the memory to analyze the treatment apparatus geometry.
REFERENCES:
patent: 3861807 (1975-01-01), Lescrenier et al.
patent: 3987281 (1976-10-01), Hodes et al.
patent: 4455609 (1984-06-01), Inamura et al.
patent: 5373844 (1994-12-01), Smith et al.
patent: 5511549 (1996-04-01), Legg et al.
patent: 5596619 (1997-01-01), Carol
patent: 5754623 (1998-05-01), Seki et al.
patent: 5772594 (1998-06-01), Barrick
patent: 6032066 (2000-02-01), Lu et al.
patent: 6360116 (2002-03-01), Jackson et al.
patent: 6405072 (2002-06-01), Cosman
patent: 6435717 (2002-08-01), Kohler et al.
patent: 6535574 (2003-03-01), Collins et al.
patent: 6560311 (2003-05-01), Shepard et al.
patent: 2002/0080915 (2002-06-01), Frohlich
patent: 2002/0122530 (2002-09-01), Erbel et al.
patent: 2002/0193685 (2002-12-01), Mate et al.
patent: 2004/0015077 (2004-01-01), Sati et al.
patent: 2004/0122311 (2004-06-01), Cosman
patent: 2004/0138556 (2004-07-01), Cosman
patent: 2005/0020917 (2005-01-01), Scherch
patent: 103 35 037 (2005-03-01), None
patent: 0 910 990 (1999-04-01), None
patent: 0911065 (1999-04-01), None
patent: 1041918 (2000-11-01), None
patent: 1 419 801 (2004-05-01), None
patent: WO 99/27839 (1999-06-01), None
patent: WO 00/47103 (2000-08-01), None
patent: WO 00/56215 (2000-09-01), None
patent: WO 01/06924 (2001-02-01), None
patent: WO 02/09588 (2002-02-01), None
patent: WO 02/49044 (2002-06-01), None
patent: WO 2005/018734 (2005-03-01), None
patent: WO 2005/099819 (2005-10-01), None
Scherch John David
Smetak Edward Charles
Best Medical International, Inc.
Kiknadze Irakli
LandOfFree
System for analyzing the geometry of a radiation treatment... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for analyzing the geometry of a radiation treatment..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for analyzing the geometry of a radiation treatment... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4192948