System for 2-D and 3-D vision inspection

Details System for 2-D and 3-D vision inspection System for 2-D and 3-D vision inspection

2005-09-01

2009-08-11

Toatley, Jr., Gregory J (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

C356S601000

Reexamination Certificate

active

07573569

ABSTRACT:
There is disclosed an inspection system that combines 2-D inspection and 3-D inspection of the components of an electronic device into one compact module. The inspection system of the present invention comprises a 2-D image acquisition assembly for inspecting 2-D criteria of the components, a 3-D image acquisition assembly for inspecting 3-D criteria of the components, and a computer for control and data analyzing. The 3-D image acquisition assembly comprises a 3-D image sensor and a 3-D light source. The 3-D light source is preferably a laser capable of generating a planar sheet of light that is substantially perpendicular to the inspection plane of the electronic device. The 2-D image acquisition assembly comprises a 2-D sensor and a 2-D light source positioned above the holder. The 2D and 3D image acquisition assemblies are arranged so that the 2D inspection and 3D inspection can be done while the electronic device is being held in one location.

REFERENCES:
patent: 2002/0030808 (2002-03-01), Bostrom et al.
patent: 2007/0103675 (2007-05-01), Vodanovic

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